SA-AM-OS3: Optical Microscopy Imaging |
Session Type: Oral |
Time: Saturday, April 8, 09:30 - 10:50 |
Location: Salon J |
Chair: Michael Unser, Ecole Polytechnique Federale de Lausanne, Switzerland |
SA-AM-OS3.1: A NOVEL RESOLUTION MEASURE FOR OPTICAL MICROSCOPES: STOCHASTIC ANALYSIS OF THE PERFORMANCE LIMITS |
Sripad Ram; University of Texas Southwestern Medical Center |
E. Sally Ward; University of Texas Southwestern Medical Center |
Raimund J. Ober; University of Texas, Dallas |
SA-AM-OS3.2: EXTENDED DEPTH-OF-FIELD USING ADJACENT PLANE DEBLURRING AND MPP WAVELET FUSION FOR MICROSCOPE IMAGES |
Hyohoon Choi; University of Texas |
Samuel Cheng; Advanced Digital Imaging Research, LLC |
Qiang Wu; Advanced Digital Imaging Research, LLC |
Kenneth Castleman; Advanced Digital Imaging Research, LLC |
Alan Bovik; University of Texas |
SA-AM-OS3.3: JOINT TEXTURE AND TOPOGRAPHY ESTIMATION FOR EXTENDED DEPTH OF FIELD IN BRIGHTFIELD MICROSCOPY |
François Aguet; Ecole Polytechnique Fédérale de Lausanne (EPFL) |
Dimitri Van De Ville; Ecole Polytechnique Fédérale de Lausanne (EPFL) |
Michael Unser; Ecole Polytechnique Fédérale de Lausanne (EPFL) |
SA-AM-OS3.4: WIDE-FIELD EXTRINSIC OPTICAL SIGNAL IMAGING OF FLUORESCENCE POTASSIUM SENSORS |
Rahul Pujari; Louisiana Tech University |
Pankaj Shitole; Louisiana Tech University |
Vinod Charnani; Louisiana Tech University |
Michael McShane; Louisiana Tech University |
Charles Robinson; Clarkson University |