Loog Tax

Machine Learning for Biomedical Image Analysis

Wednesday, April 14, 08:30 - 12:15

Presented by

Presented by Marco Loog (Delft University of Technology, The Netherlands) and David Tax (Delft University of Technology, The Netherlands)

Description

Machine learning and pattern recognition techniques utilize exemplary data rather than models to solve certain decision tasks. They enable their users to exploit various sources of data (images, annotations, general patient data, etc.) even if prior knowledge on the nature of these data and their interrelationship is limited or weak. More specifically, supervised machine learning and pattern recognition methods aim to "learn" a potentially complex input / output relation of interest from given example input / output pairs.

Machine learning plays a role of increasing importance in many biomedical image analysis and processing challenges. This tutorial offers a brief, and hopefully nonstandard, introduction to the basics of machine learning together with an overview of the key components and main considerations that play a role in good machine learning practice. The focus in this is on classification problems. While the basics are the topic of the first block, the second takes these as a prerequisite and presents various extensions to this standard, and in a sense limited, view of machine learning. It provides an overview of several techniques that have received increased attention in the past years.

Various concepts are illustrated by means of research examples and biomedical applications.

Part I: Established and Standard Techniques

A condensed overview of the standard classification pipeline is given. Various classifiers are touched upon (think linear discriminants, support vector machines, boosting, classifier combinations, ensemble methods, nearest neighbor methods), and representation and evaluation issues are briefly considered.

Part II: Emerging and Less Standard Approaches

Deviations from the standard setting (from Part I) are considered and more realistic and, potentially, more powerful methods are discussed. We make a case for research into these "emerging" and less standard directions. Topics are multiple instance learning, semi-supervised learning, active learning, and learning under non-standard cost.

A Rather Biased List of References

Speaker Biographies

David M.J. Tax received his Ph.D. in 2001 at the Delft University of Technology in the Pattern Recognition Group, under the supervision of R.P.W. Duin and based on his thesis 'One-Class Classification'. Currently, he is an assistent professor in the Pattern Recognition Laboratory at Delft University of Technology. His main research interests are the learning and development of detection algorithms, the representation of data, simple and elegant classifiers and the fair evaluation of such methods.

Marco Loog received a Ph.D. degree from the Image Sciences Institute, NL, for the development and improvement of statistical pattern recognition methods and their use in the processing and analysis of images. After this joyful event, he moved to Copenhagen, DK, were he acted as assistant and, eventually, associate professor. After several splendid years, Marco moved to Delft University of Technology where he now works as an assistant professor in the Pattern Recognition Laboratory. Currently, his ever-evolving research interests include multiscale image analysis, semi-supervised and multi-instance learning, saliency, the dissimilarity approach, and black math.